Multitrait, Random Regression, or Simple Repeatability Model in High‐Throughput Phenotyping Data Improve Genomic Prediction for Wheat Grain Yield
نویسندگان
چکیده
منابع مشابه
Multitrait, Random Regression, or Simple Repeatability Model in High-Throughput Phenotyping Data Improve Genomic Prediction for Wheat Grain Yield.
High-throughput phenotyping (HTP) platforms can be used to measure traits that are genetically correlated with wheat ( L.) grain yield across time. Incorporating such secondary traits in the multivariate pedigree and genomic prediction models would be desirable to improve indirect selection for grain yield. In this study, we evaluated three statistical models, simple repeatability (SR), multitr...
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ژورنال
عنوان ژورنال: The Plant Genome
سال: 2017
ISSN: 1940-3372,1940-3372
DOI: 10.3835/plantgenome2016.11.0111